A structure of advanced self-testing digital frequency synthesizers built in integrated-circuit form

Аuthors

Ryazanov A. V.

Arzamas Polytechnic Institute (branch) of the Alekseev Nizhny Novgorod State Technical University, 19, Kalinin str., Arzamas, Nizhny Novgorod Region, 607220, Russia

Abstract

A generalized structure scheme design is considered for an advanced large-scale integration circuit implementing digital frequency synthesizer. The synthesizer includes self-testing tools based on the signature analysis.