A thickness of surface film estimation by means of electrical measurements within metal-to-metal contact

Аuthors

Vikulov A. G.

Moscow Aviation Institute (National Research University), 4, Volokolamskoe shosse, Moscow, А-80, GSP-3, 125993, Russia

Abstract

An experimental technique is offered to estimate a thickness of film-on-metal (surface films). The technique is based on the Kholms theory as well as on some procedure to compute the real contact surface according to surface properties and mechanical characteristics of the contact. A quantitative analysis is carried out to evaluate an influence of average contact temperature and surface film thickness on emission and electron tunneling through contact area.